Wafer Test
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Wire Probe Head

● Good temperature behavior(-40℃ to 鐘錢125℃)

● Low contact force , no什爸 risk for the CUP

    padPro睡算be head spacer design to 黑制extend test lifetime

● Simple design , easy e微工xchange of needles and can be done onsi暗員te

● Replaceable test h黑你ead

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