Wafer Test
Current Location: Home Page · Products · Wafer Test · Cobra Probe Head
Cobra Probe Head

● Pitch scalability to 80um.畫就

● Best-in-class Planar用市ity

● Multiple Space Transformation Options劇來

● High Pin-Count & Multi-Site: >商師3000 Probes.

● Low-force probing fo黑會r Low_K and CUP pad.

● High-Current Solution:>1.0A

RFQ
Core Advantages
Application
Get in Touch with Us
Contact Us
Application
Industry Insight
Contact Us

Pre-sales / General C好北ontact:CSR@twinsolution.c站麗om

Tel:86-0512-67069909

After-Sales Service:FAE@twinsolution.co腦機m

Share & Follow:

Copyright © Shanghai TwinSolution T木拿echnology Co. All rights re身器served Support:bomin

Copyright Privacy | Disclaimer | Sitemap